安勤科技

Processor

Rockchip RK3576
Quad-core Cortex-A72 and Quad-core Cortex-A53

System Memory

LPDDR4, 4GB (8GB~ 16GB optional)

M.2

1 x M.2 Key-M 2242 (PCIe Gen2 x1) for NVMe SSD
1 x Full Size Mini-PCIe (PCIe Gen2 x1, USB 2.0) with Micro SIM for LTE
Note: M.2 and Mini PCIe share the same PCIe Gen2 x1 interface. Simultaneous PCIe operation is not supported.

eMMC

64GB（32~256G Optional）

DC Input Connector

DC 12~24V

Network

2 x 10M/100M/1000M Ethernet with RJ45

HDMI

1 x HDMI®2.1 8K@60fps or 4K@120fps (output)

Audio

1 × 3.5 mm 4-pole Headset Jack 1 x SPDIF

Antenna

2x (2*4G antenna or 2*WiFi antenna, optional)

LED Indicator

2 x RJ45 LED

USB

1 x USB3.0 Type A
1 x USB2.0 Type A
1x USB 3.2 Gen1 type C (OTG:supports Host, ADB and Firmware Update)

Digital I/O

GPIO 6bits 3.3V/5V with terminal block

Bluetooth

BT 5.3 (optional)

WI-FI

Wi-Fi 6 (802.11a/b/g/n/ac/ax), 2.4/5 GHz, 2T2R (optional)

Multiple Display

1 x HDMI®2.1 8K@60fps or 4K @60Hz
1 x LVDS or MIPI_DSI 2560 × 1600 @60Hz (internal conn.)
1 x USB Type C DP Alt. mode 1920 × 1080 @60Hz

OS

Debian 12 & Andriod14

Operating Temp.

0°C~50°C

Storage Temp.

-40~85°C

Operating Humidity

40℃ @ 95% Relative Humidity, Non-condensing

Dimension (W x L x H)

203mm×107mm×50mm

Vibration Test

Random Vibration Operation
1 Test PSD : 0.00454G²/Hz , 1.5 Grms
2 System condition : operation mode
3 Test frequency : 5~500 Hz
4 Test axis : X,Y and Z axis
5 Test time : 30 minutes per each axis
6 IEC60068-2-64 Test Fh
6 Storage : SSD
Sine Vibration test (Non-operation)
1 Test Acceleration : 2G
2 Test frequency : 5~500 Hz
3 Sweep：1 Oct/ per one minute. (logarithmic)
4 Test Axis : X,Y and Z axis
5 Test time :30 min. each axis
6 System condition : Non-Operating mode
7. Reference IEC 60068-2-6 Testing procedures
Package Vibration Test:
1 Test PSD : 0.026G²/Hz , 2.16 Grms
2 Test frequency : 5~500 Hz
3 Test axis : X,Y and Z axis
4 Test time : 30 minutes per each axis
5 IEC 60068-2-64 Test Fh

Shock Test

1. Wave form：Half Sine wave
2. Acceleration Rate：10g for operation mode
3. Duration Time：11ms
4. No. of Shock：Z axis 300 times
5. Test Axis: Z axis
6. Operation mode
7. Reference IEC 60068-2-27:1987 Testing procedures
Test Ea : Shock Test

Drop Test

Package drop test
Reference ISTA 2A, Method : IEC-60068-2-32 Test:Ed
Test Ea : Drop Test
1 Test phase : One corner, three edges, six faces
2 Test high : 96.5cm
3 Package weight : 5Kg
4 Test drawing

Mounting Kit

Din rail

Internal I/O Connector

(1) UART Debug
(2) COM port: 2x RS232 4pin, 2.0mm; 2x RS485 4pin, 2.0mm
(3) USB: 2x 4 pin, 2.0mm
(4) CAN bus: 1 x 4Pin, 2.0mm
(5) LVDS: 2 x 15Pin, 2.0mm
(6) MIPI DSI: 1 x 40P FPC, pitch 0.5mm
(7) Backlight: 1 x 6Pin, 2.0mm
(8) Touch Panel: 1 x 6Pin FPC, 0.5mm
(9) Speaker: 1 x 4Pin, 2.0mm