AIB-3576
规格
System Information
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Processor
Rockchip RK3576
Quad-core Cortex-A72 and Quad-core Cortex-A53 -
System Memory
LPDDR4, 4GB (8GB~ 16GB optional)
Expansion
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M.2
1 x M.2 Key-M 2242 (PCIe Gen2 x1) for NVMe SSD
1 x Full Size Mini-PCIe (PCIe Gen2 x1, USB 2.0) with Micro SIM for LTE
Note: M.2 and Mini PCIe share the same PCIe Gen2 x1 interface. Simultaneous PCIe operation is not supported.
Storage
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eMMC
64GB（32~256G Optional）
Front I/O
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DC Input Connector
DC 12~24V
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Network
2 x 10M/100M/1000M Ethernet with RJ45
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HDMI
1 x HDMI®2.1 8K@60fps or 4K@120fps (output)
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Audio
1 × 3.5 mm 4-pole Headset Jack 1 x SPDIF
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Antenna
2x (2*4G antenna or 2*WiFi antenna, optional)
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LED Indicator
2 x RJ45 LED
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USB
1 x USB3.0 Type A
1 x USB2.0 Type A
1x USB 3.2 Gen1 type C (OTG:supports Host, ADB and Firmware Update)
Rear I/O
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Digital I/O
GPIO 6bits 3.3V/5V with terminal block
I/O
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Bluetooth
BT 5.3 (optional)
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WI-FI
Wi-Fi 6 (802.11a/b/g/n/ac/ax), 2.4/5 GHz, 2T2R (optional)
Display
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Multiple Display
1 x HDMI®2.1 8K@60fps or 4K @60Hz
1 x LVDS or MIPI_DSI 2560 × 1600 @60Hz (internal conn.)
1 x USB Type C DP Alt. mode 1920 × 1080 @60Hz
Software Support
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OS
Debian 12 & Andriod14
Mechanical & Environmental
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Operating Temp.
0°C~50°C
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Storage Temp.
-40~85°C
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Operating Humidity
40℃ @ 95% Relative Humidity, Non-condensing
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Dimension (W x L x H)
203mm×107mm×50mm
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Vibration Test
Random Vibration Operation
1 Test PSD : 0.00454G²/Hz , 1.5 Grms
2 System condition : operation mode
3 Test frequency : 5~500 Hz
4 Test axis : X,Y and Z axis
5 Test time : 30 minutes per each axis
6 IEC60068-2-64 Test Fh
6 Storage : SSD
Sine Vibration test (Non-operation)
1 Test Acceleration : 2G
2 Test frequency : 5~500 Hz
3 Sweep：1 Oct/ per one minute. (logarithmic)
4 Test Axis : X,Y and Z axis
5 Test time :30 min. each axis
6 System condition : Non-Operating mode
7. Reference IEC 60068-2-6 Testing procedures
Package Vibration Test:
1 Test PSD : 0.026G²/Hz , 2.16 Grms
2 Test frequency : 5~500 Hz
3 Test axis : X,Y and Z axis
4 Test time : 30 minutes per each axis
5 IEC 60068-2-64 Test Fh -
Shock Test
1. Wave form：Half Sine wave
2. Acceleration Rate：10g for operation mode
3. Duration Time：11ms
4. No. of Shock：Z axis 300 times
5. Test Axis: Z axis
6. Operation mode
7. Reference IEC 60068-2-27:1987 Testing procedures
Test Ea : Shock Test -
Drop Test
Package drop test
Reference ISTA 2A, Method : IEC-60068-2-32 Test:Ed
Test Ea : Drop Test
1 Test phase : One corner, three edges, six faces
2 Test high : 96.5cm
3 Package weight : 5Kg
4 Test drawing -
Mounting Kit
Din rail
Internal I/O Connector
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Internal I/O Connector
(1) UART Debug
(2) COM port: 2x RS232 4pin, 2.0mm; 2x RS485 4pin, 2.0mm
(3) USB: 2x 4 pin, 2.0mm
(4) CAN bus: 1 x 4Pin, 2.0mm
(5) LVDS: 2 x 15Pin, 2.0mm
(6) MIPI DSI: 1 x 40P FPC, pitch 0.5mm
(7) Backlight: 1 x 6Pin, 2.0mm
(8) Touch Panel: 1 x 6Pin FPC, 0.5mm
(9) Speaker: 1 x 4Pin, 2.0mm